NANOBASE Vector Logo for SpringSciX 2022

Flexible High Performance Raman Solutions

Nanobase’s spectrometers deliver >90% peak efficiency through an innovative transmission grating technology. This delivers ultra-high speed scanning over a wider area (>200 µm x 200 µm. see graphs). The modular design allows flexibility for future enhancements and easy integration with existing equipment such as Flim, Photocurrent measurements. AFM…

Xper RF

Hybrid micro Raman instrument (with optional FLIM)

  • Raman, PL, EL, FLIm, TCSPC
  • Up to three Freespace lasers
  • Pulsed laser for TRPL measurement
  • Over 90% peak efficiency
  • 200 x 200 μm scanning area on 40X objective

XperRam S

Micro Raman instrument

  • Raman, PL, EL
  • Up to three Freespace lasers
  • Over 90% peak efficiency
  • 200 x 200 μm scanning area on 40X objective
  • Fully customizable

XperRam C

Micro Raman instrument

  • Raman, PL, EL
    Only one laser equipped
  • Over 90% peak efficiency
  • 200 x 200 μm scanning area on 40X objective
  • Compact and budget friendly

XperRAM M Series

Macro Raman instrument

  • Raman, PL, EL
  • Only one laser equipped
  • 532 nm or 785 nm laser options
  • Over 90% peak efficiency
  • Laser probe customizable
  • Optional Z-axis control holder

Xper RF

Hybrid micro Raman instrument (with optional FLIM)

  • Raman, PL, EL, FLIm, TCSPC
  • Up to three Freespace lasers
  • Pulsed laser for TRPL measurement
  • Over 90% peak efficiency
  • 200 x 200 μm scanning area on 40X objective

Xper-FLIM

Fluorescence Lifetime imaging

  • FLIm, TCSPC
  • Photon detection efficiency 49% at 550 nm
  • 1 or 2 channels for time tagging electronics
  • 200 x 200 μm scanning area on 40X objective
  • Flexible microscope options

Xper-PC

Photo current imaging and analysis

  • Photocurrent imaging and measuring (source/drain, gate dependence)
  • Up to three Freespace lasers
  • 200 x 200 μm scanning area on 40X objective
  • Probe positioner and stage fully customizable
  • Bending or straight probe tip

Xper IP Mini

Non-destructive optical thickness measurement.    

Powerful, affordable thickness measurement of transparent samples.  Range between 1.2 mm -0.03 mm +/- 0.2% accuracy.

Custom Projects – example 1:

An XperRAM S was modified for studies on the electrical and optical properties of wire bonded materials such as Si wafer in one system. A supercontinuum laser source was used.

Custom Projects – example 2:

Modified Raman spectroscopy system based on XperRAM C Series for real-time monitoring of CVD process. We also developed a long, sealed probe to protect from exposure to chemicals for this project

The graphs illustrate the superior efficiency of Nanobase’s use of VPH transmission gratings (Volume PHase Grating) over lens-based techniques.