
Flexible High Performance Raman Solutions
Nanobase’s spectrometers deliver >90% peak efficiency through an innovative transmission grating technology. This delivers ultra-high speed scanning over a wider area (>200 µm x 200 µm. see graphs). The modular design allows flexibility for future enhancements and easy integration with existing equipment such as Flim, Photocurrent measurements. AFM…
XperRam S
Micro Raman instrument
- Raman, PL, EL
- Up to three Freespace lasers
- Over 90% peak efficiency
- 200 x 200 μm scanning area on 40X objective
- Fully customizable
Xper-FLIM
Fluorescence Lifetime imaging
- FLIm, TCSPC
- Photon detection efficiency 49% at 550 nm
- 1 or 2 channels for time tagging electronics
- 200 x 200 μm scanning area on 40X objective
- Flexible microscope options
Xper-PC
Photo current imaging and analysis
- Photocurrent imaging and measuring (source/drain, gate dependence)
- Up to three Freespace lasers
- 200 x 200 μm scanning area on 40X objective
- Probe positioner and stage fully customizable
- Bending or straight probe tip
Xper IP Mini
Non-destructive optical thickness measurement.
Powerful, affordable thickness measurement of transparent samples. Range between 1.2 mm -0.03 mm +/- 0.2% accuracy.

The graphs illustrate the superior efficiency of Nanobase’s use of VPH transmission gratings (Volume PHase Grating) over lens-based techniques.